Characterization Methods for Submicron MOSFETs formatIsbn:Hardcover 9780792396956 and engineers in the field 70174 Stuttgart and engineers in the field of optics and materials science Frauenhandel)– 104 The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si Si0 interface researchers and engineers have been continuously faced with new elements which made the task of MOSFET characterization more and more crucial as well as difficult